Analysis Category |
tp2tp tp2tp;<PkgType> tp2tp;<PkgTypeA>_<PkgTypeB> |
Measurement Shape Measurement IDs |
Segment Two testpoint pads |
Layers Displayed |
Top or bottom signal layer. Corresponding solder mask layer if v_exposed_tp=1. |
Graphic |
|
Purpose |
Testpoints should be kept sufficiently apart in order to allow simultaneous probing without collision. |
Function |
Reports distances between testpoints that are less than pp_t_spacing for these cases:
The distance is measured from pad center to pad center. |
ERF Parameters |
|
ERF Variables |
v_testpoint_attr v_tp2tp_by_side = no |
Constraint |
Testpoint to Testpoint |
Change in Behavior |
When one or two of the testpoints are also toeprints of a component, the result is classified by their comp_type. Therefore, this category can be classified by two, one or no comp_type, depending upon where they are situated. |
Limitations |