ERF Variable |
Description |
Categories Affected |
|---|---|---|
len2width_ratio |
Minimum ratio of length to width for the ‘Line Widths’ category. |
Line Widths |
max_line_width |
Maximum line width of lines in the ‘Line Widths’ category |
Line Widths |
min_line_len |
Minimum line length of lines in the ‘Line Widths’ category, also minimum overlap between lines to report in parallel spacing |
Line Widths |
v_hole_clearance_consider_sm |
Determines whether to report only drills within SM clearances too close to silk screen features or all drills, even those without SM clearances. yes — Report spacing violations only if SM clearance is present. (default) no — Report all spacing violations. |
PTH Pad Clearance Via Pad Clearance NPTH Pad Clearance Undrilled Pad Clearance NPTH Clearance PTH Clearance Via Clearance |
v_one_width_report_per_letter |
Determines how line width of silk screen features is reported. no — Report line width for each individual feature yes — Report the line width of one feature of a group of connected features (as in a letter or number) |
Line Widths |
v_report_include_sm_as_zero |
Determines whether to report silk screen features completely covered or included in solder mask features. 0 — (default) Do not report silk screen features completely covered or included in solder mask features. 1 — Report such features as a segment of zero length. |
SM Clearance |
v_report_only_string_feature |
Determines which silk screen features are reported. no — Reports all silk screen features. (default) yes — Reports only silk screen features with the attribute String Value. |
SM Clearance SMD Clearance All Pad Clearance categories All Hole Clearance categories |
v_results_grouping |
Determines how silk screen results are reported. 0 — (default) no grouping of silk screen results is performed and each measurement between a silk screen feature and another feature is reported individually. 1— Silk screen results are grouped according to the same String Value attribute, and only one measurement is reported between the grouped features and other features. 2 — Silk screen results are grouped and the measurement between the group and another feature is the shortest measurement possible. If the non-silk screen feature (smd, sm, drill, etc.) is larger than 200 mil, mode 1 is used. See “Grouping of Silk Screen Results” for an illustration. |
SM Clearance SMD Clearance All Pad Clearance categories All Hole Clearance categories |