ERF Variables for Solder Mask Checks
ERF Variable |
Description |
Categories Affected |
|---|---|---|
categorize_negative_ar |
Determines whether SM negative annular rings are reported. 0 — Report SM negative annular rings (gaskets) as r0. (default) 1 — Report measurement of SM negative annular rings. |
SMD Annular Ring SMD Pad Gasket PTH Pad Gasket NPTH Pad Gasket Via Pad Gasket Undrilled Pad Gasket |
classify_pad_ar |
Determines whether SM pad annular ring measurements are classified according to type. 0 — Report all SM pad annular ring measurements in ‘Pad Annular Ring’. (default) 1 — Report SM pad annular ring according to type. (PTH, NPTH, via, undrilled) 2 — Maintains compatibility between earlier products and DFM Analysis by mapping to 1. |
Pad Annular Ring PTH Pad Annular Ring NPTH Pad Annular Ring Via Pad Annular Ring |
cover_dist_to_cu |
Controls whether a measurement from non-exposed copper is the closest distance to the solder mask clearance or the closest distance to the SM clearance in the direction of the exposed copper within it: 1 — Report distance from non-exposed copper to SM clearance in the direction of the exposed copper. (default) 0 —
Report closest distance from non-exposed copper to solder mask clearance. |
Coverage |
cover_ignore_intersection |
Determines whether features intersecting SM clearances are reported. 0 — Report features intersecting SM clearances. (default) 1 — Do not report features intersecting SM clearances. If a copper feature is not entirely within an SM clearance, the system checks for a pad partly within and with its center inside. If found, it and its intersecting traces are ignored. |
Coverage |
cover_ignore_same_net |
Determines whether copper features of the same net within the SM clearance are ignored. 0 — Report copper features of the same net. (default) 1 — Ignore copper features of the same net. |
Coverage |
cover_special_check |
Determines whether a special check of nets intersecting with a SM clearance twice are checked in the ‘Coverage’ category. 0 — If a signal net has a pad covered completely by SM clearance, ignore intersections between its features and the clearance. (default) 1 — Check for more than one intersection in solder mask clearance where the first is legal (a signal trace connected directly to the covered pad) and report all others as a violation. Note: A check requires considerable processing time. |
Coverage |
full_tp_exposure |
Determines which types of testpoints should be considered exposed by solder mask clearance. 0 — Does not report testpoint pads that are included or include a solder mask clearance. (default) 1 — Does not report testpoint pads that are fully included in a solder mask clearance. |
Missing Testpoint Clearance |
ignore_miss_via |
Determines whether missing vias are reported. 1 — Do not report missing vias. (default) 0 — Report missing vias. |
Missing Via Clearance |
replace_crosshatch_by_surface |
yes — Do not report slivers found on hatched area. (default) (Gerber) no — Report slivers found on hatched area. by attr — Do not report slivers found on features with a hatch attribute. (EDA) |
SM Sliver SM Short Sliver |
v_dist2sliver_ratio |
Minimal ratio for the distance between measurement segment endpoints along the net and the width of the sliver. |
SM Sliver SM Short Sliver |
v_max_net_size |
Nets with more than v_max_net_size features are ignored. |
SM Sliver SM Short Sliver |
v_min_sliver_len |
Slivers shorter than this value are reported as ‘Short Sliver’. All others are reported in ‘Sliver’. Maximum possible value is 100 mils. |
SM Sliver SM Short Sliver |
v_min_sliver_perim |
Defines the minimal distance between the measurement segment endpoints along the net. (For a description of perimeter, see “SM Short Sliver (Sliver)”). |
SM Sliver SM Short Sliver |
v_report_only_one_side_sm |
Determines how drills that do not touch a solder mask clearance are reported. no — Report all locations that do not touch any solder mask clearances. (default) yes — Report only those locations that do not touch solder mask clearances on one side only. |
Missing NPTH Clearance Missing PTH Clearance Missing Via Clearance |
v_report_proximity |
Defines the size of area for reporting solder mask coverage violations. Only one violation between a clearance and signal layer net is reported. (Default=20 mil; minimum value=5mil. If a value less than the minimum is entered, 5 mil is used.) Example: If v_report_proximity = 10, from all the ‘same net’ violations within a square of 10x10, only one is reported. |
Coverage |
v_sliver_algorithm_mode |
Defines which of two algorithms is used to determine sliver violations. 0 — Use original algorithm where results are reported to the ‘Sliver’ category. (slow) 1 — Use improved algorithm where results are reported to either the ‘Sliver’ or ‘Short Sliver’ category. (fast) (default) 2 — Results are the same as with 1, but the process is slower. (Remains in the system to insure backward compatibility.) |
SM Sliver SM Short Sliver |
