ERF Variable |
Description |
Categories Affected |
|---|---|---|
classify_pad_ar |
Determines how via or PTH measurements are reported. yes — Classify AR measurement according to via or PTH in ‘Via Annular Ring’ or ‘PTH (Comp) Annular Ring’. (default) no — Report all via or PTH measurements in ‘PTH Annular Ring’. |
PTH Annular Ring PTH (Comp) Annular Ring Blind Via Annular Ring Buried Via Annular Ring |
classify_pad2pad |
no — All measurements reported to ‘Pad to Pad’ category. (default) yes — Distributes measurements to the following categories, depending on pad type:
|
Via to Via Pad to Pad |
classify_via2c |
0 — Do not distinguish between via and PTH measurements to copper. Report both in ‘PTH to Copper’. (default) 1 — Distinguish between via and PTH holes. Report measurements in ‘Via to Copper’ or ‘PTH to Copper’. |
PTH to Copper PTH to Copper Same Net Via to Copper |
group_drill_to_copper |
Determines whether to report only the closest violation or all violations. 1 — For each drill (NPTH, PTH, or via) only the closest spacing violation is reported to its respective category. If there are both pad and circuit spacing violates with NPTHs, only the closest is reported in its respective category (either ‘NPTH to Pad’ or ‘NPTH to Circuit’). The category of the other violation does not appear. (default) 0 — All spacing violations are reported, each to its respective category. |
NPTH to Pad NPTH to Circuit PTH to Copper PTH to Copper Same Net Via to Copper |
large_net_min |
Nets with more than large_net_min features are ignored in ‘Same Net Spacing’, ‘Sliver’ and ‘Short Sliver’ categories. |
Same Net Spacing Sliver Short Sliver |
len2width_ratio |
Minimum ratio of length to width of a line to be inserted in the ‘Lines’ category. |
Lines |
limited_npth_check |
Determines whether NPTH annular ring values larger than pp_d2c are reported. yes — Only distances less than pp_d2c are reported. (default) no — All values reported. |
NPTH Annular Ring |
max_bottleneck_width |
Maximum bottleneck width for ‘Conductor Width’ and ‘Copper Bottleneck’. |
Conductor Width |
max_line_width |
Maximum line width in ‘Lines’ category. |
Lines Line Neckdown Arc |
max_reg |
Maximum offset to be considered a registration error. A center to center distance of a drill and pad larger than this value, is not reported. |
PTH Registration NPTH Registration |
min_line_len |
Minimum line length in ‘Lines’ category. Also the minimum overlap between lines to report in parallel spacing. |
Lines Spacing |
pth_breakout_angle |
Defines maximum angle allowed for breakout of drill from PTH pad. |
PTH Annular Ring PTH (Comp) Annular Ring |
reg_allowance |
A distance between pad center and drill center greater than this value is considered misregistered. |
PTH Registration NPTH Registration |
replace_crosshatch_by_surface |
Determines how slivers are reported. yes — Do not report slivers found on hatched area. (default) (Gerber) no — Report slivers found on hatched area. by attr — Do not report slivers found on features with a hatch attribute. (EDA) |
Sliver Short Sliver |
report_lines_with_arcs |
Determines how lines with arcs are reported. yes — Arc sizes are reported to ‘Lines’ or ‘Shaved Line’. (default) no — Arc sizes are reported in ‘Arcs’ or ‘Shaved Arcs’. |
Lines Shaved Line Arc Shaved Arc |
rm_d2c |
Reliability margin for all drill to copper measurements other than annular ring. Used in the calculation of the DRA attributes. |
Affects the reporting of result attributes for drill categories |
self_spacing |
Determines whether self-spacing measurements are taken. yes — Self-spacing measurements are taken. (default) no — Self-spacing measurements are not taken. |
Same Net Spacing (Spacing) Same Net Spacing (Bottleneck) |
spacing_length_measure |
Determines whether parallel spacing measurements are taken. yes — Parallel spacing measurements are taken. (default) no — Measurements are not taken. |
Spacing Length |
spacing_resolution |
Determines the resolution for parallel spacing report. (1mil = default) |
Spacing Length |
v_bottleneck_algorithm_mode |
Defines which of two algorithms is used to determine bottleneck violations. 0 — Use original algorithm where results are reported to ‘Conductor Width’ (Bottleneck) and ‘Same Net Spacing’ (Bottleneck). (slow) 1 — Use improved algorithm where results are reported to ‘Copper Bottleneck’ (Bottleneck). (default) (fast) 2 — Results are the same as with 1, but the process is slower. (Remains in the system to insure backward compatibility.) |
Conductor Width (Bottleneck) Same Net Spacing (Bottleneck) |
v_conductor_width_full_check |
Determines how conductor width is checked. no — Conductor width is not checked if a line or arc is touched by more than a certain, threshold, number of negative shapes (neckdowns). The result is better performance. (default) yes — Conductor width is checked, no matter the number of negative shapes. Therefore, there is a degradation in performance. |
Conductor Width |
v_dist2sliver_ratio |
Minimal ratio for the distance between measurement segment endpoints along the net and the width of the sliver. |
Sliver Short Sliver |
v_min_sliver_len |
Slivers shorter than this value are reported as ‘Short Sliver’. All others are reported in ‘Sliver’. Maximum possible value is 100 mils. |
Sliver Short Sliver |
v_min_sliver_perim |
Defines the minimal distance between the measurement segment endpoints along the net. (For a description of perimeter, see “Sliver and Short Sliver Categories (Signal Layer Checks)”). |
Sliver Short Sliver |
v_report_via_by_type |
Determines whether via annular ring violations are reported to ‘Via Annular Ring’ or to individual categories according to via type. no — Report all via annular ring violations to ‘Via Annular Ring’. (default) yes — Report via annular ring violations according to type: regular, blind or buried. |
Blind Via Annular Ring Buried Via Annular Ring |
v_sliver_algorithm_mode |
Defines which of two algorithms is used to determine sliver violations. 0 — Use original algorithm where results are reported to the ‘Sliver’ category. (slow) 1 — Use improved algorithm where results are reported to either the ‘Sliver’ or ‘Short Sliver’ category. (fast) (default) 2 — Results are the same as with 1, but the process is slower. (Remains in the system to insure backward compatibility.) |
Sliver Short Sliver |
v_slivers_check_diff_nets |
no — Do not report slivers detected between unconnected features (on different nets). (default) yes — Report slivers detected between unconnected features, and distances between close nets. |
Short Sliver |
v_split_pth2c_report |
Determines whether to report results from the same CAD net in this category along with those of different CAD nets or to ‘PTH to Copper Same Net’. no - report all results to this category. (default) yes - report same CAD net results to ‘PTH to Copper Same Net’. |
PTH to Copper PTH to Copper Same Net |
v_stubs_check_both_ends |
yes — Lines and arcs with both ends touching the same surface or feature are reported as stubs. (default) no — Ignore stubs touching the same surface or feature. |
Stubs |
v_surface_spacing_separately |
Determines whether measurements to surfaces are reported as circuits or into their own categories. no — Report surfaces as circuits to categories ‘Circuit to Circuit’, ‘Pad to Circuit’ and ‘NPTH to Circuit’. (default) yes — Report measurements to surfaces to ‘Surface to Surface’, ‘Pad to Surface’, ‘Circuit to Surface’ and ‘NPTH to Surface.’ |
Pad to Circuit NPTH to Circuit |
v_terminated_stub |
Determines whether lines with small pads at their endpoints are reported as stubs. 0 — Do not report such lines as a stub. 1 — Report lines with a pad smaller than the line endpoint (and having the same x and y coordinate) as a stub. (default) 2 — Report lines with a pad smaller than or equal to the line endpoint as a stub. |
Stubs |
v_tp_exvia_as_via |
Determines whether an exposed via with attribute ICT Test Point is considered a via (reported in ‘Exposed Via to Exposed Via’) or a copper pad (reported in ‘Exposed to Exposed’). no — Consider via pad with attribute ICT Test Point a copper pad. (default) yes —Consider via pad with attribute ICT Test Point a via. |
Exposed Via to Exposed Via Exposed Via to Exposed Copper |
via_breakout_angle |
Defines maximum angle allowed for breakout of drill from via pad. |
PTH Annular Ring Blind Via Annular Ring Buried Via Annular Ring |